Victor Chan

Overview

Victor Chan

Title

Yield learning & Diag Eng Prof

Location

IBM Research - Albany Albany, NY USA

Bio

  • Current / Recent: STSM in Yield / characterization of 2nm Nanosheet Logic; Analog AI hardware and chiplet technologies.

  • Working in semiconductor industry over 20 years in IBM.

  • Technical leadership in FEOL integration and device teams of CMOS 90 to deep sub-micron in bulk / SOI technologies, innovative and inventive delivery of process technologies from concept to qualification to manufacturing.

  • Specialties include semiconductor device & integration in R&D and production, product - customer deployment, technology licensing and technical support. Extensive experience in running lots and characterization of device / inline-metrology / PLY / Health-of-line and yield data. Device, SRAM and product yield learning and improvement through Hands-on data analysis.

Publications

Patents

Top collaborators

IA
Ishtiaq Ahsan

Ishtiaq Ahsan

Senior Manager, Yield/ Test & Characterization, IBM Semiconductor Technology Research & Development
VN
Vijay Narayanan

Vijay Narayanan

IBM Fellow & Strategist, Physics of AI. Senior Manager, PCM and AI Materials