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Publication
ASMC 2022
Conference paper
Yield Methodology and Learning in Phase Change Memory (PCM) technology for Analog Computing : Topic/category: YE: Yield Enhancement/Learning, YM: Yield Methodologies
Abstract
We discuss inline electrical testing to monitor the baseline of Analog Computing hardware using Phase Change Memory (PCM) technology. Tightening the PCM resistance distribution is necessary to meet analog computation requirement. A new yield methodology is introduced.