Ying Zhou, Gi-Joon Nam, et al.
DAC 2023
We discuss inline electrical testing to monitor the baseline of Analog Computing hardware using Phase Change Memory (PCM) technology. Tightening the PCM resistance distribution is necessary to meet analog computation requirement. A new yield methodology is introduced. A study of heater process variation, which will affect the heater height and the PCM resistance, will be discussed.
Ying Zhou, Gi-Joon Nam, et al.
DAC 2023
Abhishek Moitra, Arkapravo Ghosh, et al.
MLSYS 2025
Meikei Ieong, Kathryn W. Guarini, et al.
CICC 2003
Victor Chan, A. Gasasira, et al.
ASMC 2022