VA-1 Measuring Barrier Heights in GaAs-AlGaAs and Metal-AlGaAs Junctions by Internal Photoemission
- M. Heiblum
- M.I. Nathan
- et al.
- 1985
- IEEE T-ED
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IIIB-2 Channel Length Characterization of LDD MOSFET's-
- Jack Y. C. Sun
- Matthew R. Wordeman
- et al.
- 1985
- IEEE T-ED
A Self-Aligned 1-μm-Channel CMOS Technology with Retrograde n-Well and Thin Epitaxy
- Yuan Taur
- Genda J. Hu
- et al.
- 1985
- IEEE T-ED
Techniques for Small-Signal Analysis of Semiconductor Devices
- Steven E. Laux
- 1985
- IEEE T-ED
Probing the Minority-Carrier Quasi-Fermi Level in Epitaxial Schottky-Barrier Diodes
- Lawrence F. Wagner
- C.T. Chuang
- 1985
- IEEE T-ED
An Analytical One-Dimensional Model for Lightly Doped Drain (LDD) MOSFET Devices
- Fang-Shi J. Lai
- Jack Yuan-Chen Sun
- 1985
- IEEE T-ED
VA-5 Pseudomorphic GaInAs/GaAs Single Quantum Well High Electron Mobility Transistor
- J.J. Rosenberg
- M. Benlamri
- et al.
- 1985
- IEEE T-ED
Switch-On Transient of Shallow-Profile Bipolar Transistors
- Denny Duan-Lee Tang
- 1985
- IEEE T-ED
Stability and SER Analysis of Static RAM Cells
- Barbara Chappell
- Stanley E. Schustfr
- et al.
- 1985
- IEEE T-ED
Increasing the Current Driving Capability of Epitaxial Schottky-Barrier Diodes Using High-Energy Implantation
- C.T. Chuang
- G.P. Li
- et al.
- 1985
- IEEE T-ED