Conference paperMonte-Carlo simulations of performance scaling in strained-Si nMOSFETsArvind Kumar, Massimo V. Fischetti, et al.SISPAD 2005
PaperA Fully Scaled Submicrometer NMOS Technology Using Direct-Write E-Beam LithographyMatthew R. Wordeman, April M. Schweighart, et al.IEEE T-ED
PaperA High-Performance 0.25-μm CMOS Technology: II—TechnologyBijan Davari, Wen-Hsing Chang, et al.IEEE T-ED
PaperCollector Signal Delay in the Presence of Velocity OvershootSteven E. Laux, Wai LeeIEEE Electron Device Letters
