PublicationIEEE T-EDPaperIIIB-2 Channel Length Characterization of LDD MOSFET's-IEEE T-EDView publicationAbstractNo abstract available.Home↳ PublicationsDate01 Jan 1985PublicationIEEE T-EDAuthorsJack Y. C. SunMatthew R. WordemanSteven E. LauxIBM-affiliated at time of publicationShare
