Publications

15 results for C.C.-H. Hsu

A Comprehensive Study of Hot-Carrier Instability in P- and N-Type Poly-SI Gated MOSFET’s
- - Charles C.-H. Hsu
  - Duen-Shun Wen
  - et al.
- 1994
- IEEE Transactions on Electron Devices
Reduced hot-carrier reliability degradation of x-ray irradiated MOSFETs in a 0.25 μm CMOS technology with ultra-thin gate oxide
- - A. Acovic
  - C.C.-H. Hsu
  - et al.
- 1993
- Solid State Electronics
Experimental 0.1-um p-Channel MOSFET with p⁺-Polysilicon Gate on 35-A Gate Oxide
- - Yuan Taur
  - S. Cohen
  - et al.
- 1993
- IEEE Electron Device Letters
High transconductance 0.1 μ m pMOSFET
- - Y. Taur
  - S. Cohen
  - et al.
- 1992
- IEDM 1992
Understanding of enhanced sensitivity to Hot Carrier degradation in drain engineered n-FETs
- - C.C.-H. Hsu
  - B.S. Wu
  - et al.
- 1992
- SSDM 1992
Effect of hydrogen annealing on hot-carrier instability of X-Ray irradiated CMOS devices
- - C.C.-H. Hsu
  - L.K. Wang
  - et al.
- 1992
- Journal of Electronic Materials
A High-Performance 0.25-μm CMOS Technology: II—Technology
- - Bijan Davari
  - Wen-Hsing Chang
  - et al.
- 1992
- IEEE T-ED
A High-Performance 0.25-μm CMOS Technology: I—Design and Characterization
- - Wen-Hsing Chang
  - Bijan Davari
  - et al.
- 1992
- IEEE T-ED
Effects of X-Ray Irradiation on GIDL in MOSFET's
- - Alexandre Acovic
  - Charles Ching-Hsiang Hsu
  - et al.
- 1992
- IEEE Electron Device Letters
Mobile ion gettering in passivated P+ polysilicon gates
- - C.Y. Wong
  - C.C.-H. Hsu
  - et al.
- 1990
- VLSI Technology 1990