E. Gusev, D.A. Buchanan, et al.
Technical Digest - International Electron Devices Meeting
In this letter, we report self-aligned n-channel germanium (Ge) MOSFETs with a thin Ge oxynitride gate dielectric and tungsten gate electrode. Excellent off-state current is achieved through the reduction of junction leakage. For the first time, we have demonstrated an n-channel Ge MOSFET with a subthreshold slope of 150 mV/dec and an on-off current ratio of ∼10 4.
E. Gusev, D.A. Buchanan, et al.
Technical Digest - International Electron Devices Meeting
K. Cheng, A. Khakifirooz, et al.
IEDM 2009
D.A. Buchanan, E. Gusev, et al.
IEDM 2000
Takeshi Nogami, J. Maniscalco, et al.
IITC 2010