Publications

90 results for Meikei Ieong

High performance transistors featured in an aggressively scaled 45nm bulk CMOS technology
- - Z. Luo
  - N. Rovedo
  - et al.
- 2007
- VLSI Technology 2007
Uniaxial strain relaxation on ultra-thin strained-Si directly on insulator (SSDOI) substrates
- - Haizhou Yin
  - Z. Ren
  - et al.
- 2006
- ICSICT 2006
Patterning strategies for gate level tip-tip distance reduction in SRAM cell for 45nm and beyond
- - Haoren Zhuang
  - Helen Wang
  - et al.
- 2007
- ISTC 2007
Structure, design and process control for Cu bonded interconnects in 3D integrated circuits
- - Kuan-Neng Chen
  - Sang Hwui Lee
  - et al.
- 2006
- IEDM 2006
Critical aspects of layer transfer and alignment tolerances for 3D integration processes
- - D.C. La Tulipe
  - L.T. Shi
  - et al.
- 2006
- GBC 2006
Tunable Workfunction for Fully Silicied Gates (FUSI) and Proposed Mechanisms
- - Y.-H. Kim
  - C. Cabral Jr.
  - et al.
- 2006
- VLSI-TSA 2006
Integration of local stress techniques with strained-Si directly on insulator (SSDOI) substrates
- - Haizhou Yin
  - Z. Ren
  - et al.
- 2006
- VLSI Technology 2006
Nano-CMOS scaling: Novel devices and materials
- - Meikei Ieong
- 2006
- NMDC 2006
Investigation of FinFET devices for 32nm technologies and beyond
- - H. Shang
  - L. Chang
  - et al.
- 2006
- VLSI Technology 2006
Band-edge high-performance high-κ /metal gate n-MOSFETs using cap layers containing group IIA and IIIB elements with gate-first processing for 45 nm and beyond
- - V. Narayanan
  - V.K. Paruchuri
  - et al.
- 2006
- VLSI Technology 2006