Accuracy of an Effective Channel Length/External Resistance Extraction Algorithm for MOSFET'sSteven E. Laux1984IEEE T-ED
IVB-4 Probing the Minority-Carrier Quasi-Fermi Level in Epitaxial Schottky-Barrier DiodesL.F. Wagner1984IEEE T-ED
Generalized Scaling Theory and Its Application to a 1/4 micrometer MOSFET DesignRobert H. DennardMatthew R. Wordeman1984IEEE T-ED
IIIB-1 Degradation of 77-K MOSFET Characteristics Due to Channel Hot ElectronsJack Y. C. SunMatthew R. Wordeman1984IEEE T-ED
A General Solution Method for Two-Dimensional Nonplanar OxidationDaeje ChinSoo-Young Ohet al.1983IEEE T-ED
IIA-6 Sensitivity of Threshold Voltage and Sheet Carrier Concentration to Material and Electronic Parameters in a HEMT DeviceSandip Tiwari1983IEEE T-ED