Publications

182 results for Eduard Cartier

Ultrathin high-K metal oxides on silicon: Processing, characterization and integration issues
- - E. Gusev
  - E. Cartier
  - et al.
- 2001
- Microelectronic Engineering
Electrical characterization of Al₂O₃ n-channel MOSFETs with aluminum gates
- - L.Å. Ragnarsson
  - S. Guha
  - et al.
- 2001
- IEEE Electron Device Letters
Materials characterization of Zro₂-SiO₂ and HfO₂-SiO₂ binary oxides deposited by chemical solution deposition
- - D. Neumayer
  - E. Cartier
- 2001
- Journal of Applied Physics
High-quality aluminum oxide gate dielectrics by ultra-high-vacuum reactive atomic-beam deposition
- - S. Guha
  - E. Cartier
  - et al.
- 2001
- Journal of Applied Physics
Molecular-beam-deposited yttrium-oxide dielectrics in aluminum-gated metal-oxide-semiconductor field-effect transistors: Effective electron mobility
- - L.Å. Ragnarsson
  - S. Guha
  - et al.
- 2001
- Applied Physics Letters
Imaging of trapped charge in SiO₂ and at the SiO₂-Si interface
- - R. Ludeke
  - E. Cartier
- 2001
- Applied Physics Letters
Interface studies of tungsten gate metal-oxide-silicon capacitors
- - Huiling Shang
  - Marvin H. White
  - et al.
- 2001
- Applied Physics Letters
Robustness of ultrathin aluminum oxide dielectrics on Si(001)
- - M. Copel
  - E. Cartier
  - et al.
- 2001
- Applied Physics Letters
Formation of a stratified lanthanum silicate dielectric by reaction with Si(001)
- - M. Copel
  - E. Cartier
  - et al.
- 2001
- Applied Physics Letters
Ultrathin high-K gate stacks for advanced CMOS devices
- - E. Gusev
  - D.A. Buchanan
  - et al.
- 2001
- Technical Digest - International Electron Devices Meeting