A.W. Kleinsasser, R.E. Miller, et al.
Physical Review Letters
We describe current-voltage measurements on superconducting Nb/InGaAs junction field-effect transistors which reveal a crossover from tunneling-dominated to Andreev scattering-dominated transport at the superconductor-semiconductor contacts as Schottky barrier thickness decreases with increasing interfacial dopant concentration. These measurements are the first demonstration of such a crossover in a thin-film structure, and are of interest for investigations of hybrid superconductor-semiconductor devices, proximity effect boundary conditions, and transport in ohmic contacts to semiconductors.
A.W. Kleinsasser, R.E. Miller, et al.
Physical Review Letters
A.W. Kleinsasser, T.N. Jackson, et al.
Applied Physics Letters
Alan C. Warren, J. Woodall, et al.
Applied Physics Letters
A.W. Kleinsasser, T.N. Jackson
Japanese Journal of Applied Physics