Thin film technology for high and low Tc SQUIDs
W.J. Gallagher
EMBC 1990
We have fabricated and characterized the noise performance of well-coupled Nb-Pb alloy edge junction dc superconducting quantum interference devices (SQUIDs) with a resistively shunted inductance. The extra damping resistor removes the resonances in the current-voltage characteristics resulting in a very low value of the extrinsic energy sensitivity in flux-locked-loop operation. Numerical simulations, with the junction capacitance included, indicate that the damping resistance does not degrade noise performance until it is significantly less than the junction-shunting resistance. We also tested different SQUID designs and demonstrated that a large SQUID inductance, proposed earlier to be desirable when resistively shunted, can seriously affect the low-frequency flux noise.
W.J. Gallagher
EMBC 1990
R.B. Laibowitz, R.H. Koch, et al.
Applied Physics Letters
G.Q. Gong, C.L. Canedy, et al.
Journal of Applied Physics
J.Z. Sun, L.S. Yu-Jahnes, et al.
IEEE TAS