Silicon-on-insulator dynamic threshold ESD networks and active clamp circuitry
- S. Voldman
- D. Hui
- et al.
- 2002
- Journal of Electrostatics
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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6 results at Journal of Electrostatics
Electrostatic discharge (ESD) protection in silicon-on-insulator (SOI) CMOS technology with aluminum and copper interconnects in advanced microprocessor semiconductor chips
- S. Voldman
- D. Hui
- et al.
- 2000
- Journal of Electrostatics
CMOS-on-SOI ESD protection networks
- S. Voldman
- R. Schulz
- et al.
- 1998
- Journal of Electrostatics
Shallow trench isolation double-diobe electrostatic discharge circuit and interaction with DRAM output circuitry
- Steven H. Voldman
- Vaughn P. Gross
- et al.
- 1993
- Journal of Electrostatics
Electrometer for repeated charge exchange measurements between a microparticle and a surface: Effect of water adsorption
- L.M. Folan
- S. Arnold
- et al.
- 1990
- Journal of Electrostatics
Charge induction by thermal radiation
- H. Aspden
- 1982
- Journal of Electrostatics