Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Active clamp circuits are essential to minimize electrical overshoot and undershoot and minimize reflected signals and achieve performance objectives and reliability requirements in high performance CMOS circuits. This paper discusses for the first time the electrostatic discharge (ESD) protection circuits of silicon-on-insulator (SOI) active clamp networks, dynamic threshold MOSFET SOI ESD techniques and the synthesis of DTMOS concepts, ESD protection networks and active clamp circuitry for high-pin-count high-performance semiconductor chips. © 2002 Elsevier Science B.V. All rights reserved.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
Shiyi Chen, Daniel Martínez, et al.
Physics of Fluids
Michiel Sprik
Journal of Physics Condensed Matter