Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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11 results at IRPS 2003

Characterization of the V_T-instability in SiO₂ / HfO₂ gate dielectrics
- - A. Kerber
  - E. Cartier
  - et al.
- 2003
- IRPS 2003
Characterization of light emission from SiGe heterojunction bipolar transistor for photon emission microscopy applications
- - Stas Polonsky
  - Andrei Talalaevskii
  - et al.
- 2003
- IRPS 2003
Modeling and experimental verification of the effect of gate oxide breakdown on CMOS inverters
- - R. Rodríguez
  - J.H. Stathis
  - et al.
- 2003
- IRPS 2003
Transmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latch up
- - Alan Weger
  - Steven Voldman
  - et al.
- 2003
- IRPS 2003
Growth and scaling of oxide conduction after breakdown
- - Barry P. Linder
  - James H. Stathis
  - et al.
- 2003
- IRPS 2003
Growth and scaling of oxide conduction after breakdown
- - Barry P. Linder
  - James H. Stathis
  - et al.
- 2003
- IRPS 2003
Characterization of the V_T-instability in SIO₂/HFO₂ gate dielectrics
- - A. Kerber
  - E. Cartier
  - et al.
- 2003
- IRPS 2003
Modeling and experimental verification of the effect of gate oxide breakdown on CMOS inverters
- - R. Rodríguez
  - J.H. Stathis
  - et al.
- 2003
- IRPS 2003
Characterization of light emission from SiGe heterojunction bipolar transistor for photon emission microscopy applications
- - Stas Polonsky
  - Andrei Talalaevskii
  - et al.
- 2003
- IRPS 2003
Sige HBT performance and reliability trends through f_T of 350GHz
- - Greg Freeman
  - Jae-Sung Rieh
  - et al.
- 2003
- IRPS 2003