Effect of Lazy Rebuild on Reliability of Erasure-Coded Storage Systems
- 2022
- CTRQ 2022
Publications
778 results for Semiconductors
Scatterometry based methodologies for characterization of MRAM technology
- Manasa Medikonda
- Daniel Schmidt
- et al.
- 2022
- SPIE Advanced Lithography 2022
Etch and Patterning Development for 2nm Node Nanosheet Devices
- Eric Miller
- Indira Seshadri
- et al.
- 2022
- SPIE Advanced Lithography 2022
Templated epitaxial growth and synthesis of III-V nanostructures on silicon
- Katarzyna Hnida-Gut
- Kirsten Moselund
- et al.
- 2022
- NNW 2022
Development of SiGe Indentation Process Control for Gate-All-Around FET Technology Enablement
- Daniel Schmidt
- Aron Cepler
- et al.
- 2022
- IEEE Trans Semicond Manuf
Back-End, CMOS-Compatible Ferroelectric FinFET for Synaptic Weights
- Donato Francesco Falcone
- Mattia Halter
- et al.
- 2022
- Front. Electron. Mater.
Evolution of patterning materials towards the Moore's Law 2.0 Era
- Dario L. Goldfarb
- 2022
- Japanese Journal of Applied Physics
HPC-on-Cloud:Best Practises for HPC Workloads on a Public Cloud
- Seetharami Seelam
- Robert Walkup
- 2022
- ICPE 2022
NVMe Virtualization for Cloud Virtual Machines
- Lixiang Luo
- I-Hsin Chung
- et al.
- 2022
- ICPE 2022
In-line Raman spectroscopy for gate-all-around nanosheet device manufacturing
- Daniel Schmidt
- Curtis Durfee
- et al.
- 2022
- JM3