Publications

465 results at IEEE T-ED

Development and Experimental Verification of a Two-Dimensional Numerical Model of Piezoelectrically Induced Threshold Voltage Shifts in GaAs MESFET’s
- - Jean-Claude Ramirez
  - Patrick J. Mcnally
  - et al.
- 1988
- IEEE T-ED
Inherent and Stress-Induced Leakage in Heavily Doped Silicon Junctions
- - Edward Hackbarth
  - Denny Duan-Lee Tang
- 1988
- IEEE T-ED
Oxide-Thickness Determination in Thin-Insulator MOS Structures
- - Bruno Ricco
  - Piero Olivo
  - et al.
- 1988
- IEEE T-ED
On the Narrow-Emitter Effect of Advanced Shallow-Profile Bipolar Transistors
- - G.P. Li
  - C.T. Chuang
  - et al.
- 1988
- IEEE T-ED
Measurement of MOSFET Channel Potential Profile
- - Yew-Tong Yeow
- 1988
- IEEE T-ED
IA-3 First Observation of Ballistic Holes in a p-Type THETA Device
- - M. Heiblum
  - K. Seo
  - et al.
- 1988
- IEEE T-ED
A Permeable-Base Switching Device Using Stacked Layers of Silicon, Silicon Dioxide, and Silicon-Rich Silicon Dioxide
- - D.J. Dimaria
  - Maurizio Arienzo
- 1987
- IEEE T-ED
IIA-2 Saturable Charge FET
- - P. Solomon
  - D.J. Frank
  - et al.
- 1987
- IEEE T-ED
Nonideal Base Current in Bipolar Transistors at Low Temperatures
- - Jason C. S. Woo
  - James D. Plummer
  - et al.
- 1987
- IEEE T-ED
Submicrometer-Channel CMOS for Low-Temperature Operation
- - Jack Yuan-Chen Sun
  - Yuan Taur
  - et al.
- 1987
- IEEE T-ED