Publications

465 results at IEEE T-ED

Injection-Induced Bandgap Narrowing and Its Effects on the Low-Temperature Operation of Silicon Bipolar Transistors
- - John D. Cressler
  - Denny Duan-Lee Tang
  - et al.
- 1989
- IEEE T-ED
VIB-4 Performance of Vertically Coupled Backside Fiber-Optic Interconnects to GaAs
- - Robert W. Ade
  - Eric R. Fossum
  - et al.
- 1989
- IEEE T-ED
IIB-1 Analysis of Picosecond and Subpicosecond MSM Photodiodes with Very Low Bias Voltage
- - B.J. Van Zeghbroeck
- 1988
- IEEE T-ED
Inherent and Stress-Induced Leakage in Heavily Doped Silicon Junctions
- - Edward Hackbarth
  - Denny Duan-Lee Tang
- 1988
- IEEE T-ED
IVA-3 Surface Recombination in GaAlAs/GaAs Heterostructure Bipolar Transistors
- - Sandip Tiwari
  - David J. Frank
  - et al.
- 1988
- IEEE T-ED
Development and Experimental Verification of a Two-Dimensional Numerical Model of Piezoelectrically Induced Threshold Voltage Shifts in GaAs MESFET’s
- - Jean-Claude Ramirez
  - Patrick J. Mcnally
  - et al.
- 1988
- IEEE T-ED
Waveform Measurements in High-Speed Silicon Bipolar Circuits Using a Picosecond Photoelectron Scanning Electron Microscope
- - Paul May
  - Jean-Marc Halbout
  - et al.
- 1988
- IEEE T-ED
Identification and Implication of a Perimeter Tunneling Current Component in Advanced Self-Aligned Bipolar Transistors
- - Hackbarth LI, Edward
  - Tze Chiang Chen
- 1988
- IEEE T-ED
High-Field-Induced Degradation in Ultra-Thin SiO₂ Films
- - Piero Olivo
  - Thao N. Nguyen
  - et al.
- 1988
- IEEE T-ED
Junction Degradation in Bipolar Transistors and the Reliability Imposed Constraints to Scaling and Design
- - Denny Duan-Lee Tang
  - Edward Hackbarth
- 1988
- IEEE T-ED