Publications

307 results at IEEE Electron Device Letters

History dependence of output characteristics of silicon-on-insulator (SOI) MOSFET's
- - Keith A. Jenkins
  - J.Y.-C. Sun
  - et al.
- 1996
- IEEE Electron Device Letters
On the Transient Operation of Partially Depleted SOI NMOSFET's
- - Jacques Gautier
  - Jack Y.-C. Sun
- 1995
- IEEE Electron Device Letters
Measurement of I—V Curves of Silicon-on-Insulator (SOI) MOSFET's Without Self-Heating
- - Keith A. Jenkins
  - J.Y.-C. Sun
- 1995
- IEEE Electron Device Letters
On “Effective Channel Length” in 0.1-µm MOSFET's
- - Yuan Taur
  - Yuh-Jier Mii
  - et al.
- 1995
- IEEE Electron Device Letters
A Highly Reliable Low Temperature Al-Cu Line/Via Metallization for Sub-Half Micrometer CMOS
- - R.V. Joshi
  - H. Dalai
  - et al.
- 1995
- IEEE Electron Device Letters
Hole Trapping, Substrate Currents, and Breakdown in Thin Silicon Dioxide Films
- - D.J. Di Maria
- 1995
- IEEE Electron Device Letters
Anomalous Narrow Channel Effect in Trench-Isolated Buried-Channel P-MOSFET‘s
- - J.A. Mandelman
  - J. Alsmeier
- 1994
- IEEE Electron Device Letters
An Epitaxial Emitter-Cap SiGe-Base Bipolar Technology Optimized for Liquid-Nitrogen Temperature Operation
- - John D. Cressler
  - Emmanuel F. Crabbé
  - et al.
- 1994
- IEEE Electron Device Letters
Experimental High Performance Sub-0.1 μm Channel nMOSFET's
- - Y. Mii
  - S. Rishton
  - et al.
- 1994
- IEEE Electron Device Letters
High-Performance Emitter-Up/Down SiGe HBT's
- - Joachim N. Burghartz
  - Keith A. Jenkins
  - et al.
- 1994
- IEEE Electron Device Letters