Distribution of damage produced by ion implantation of silicon at room temperature
- B.L. Crowder
- R.S. Title
- 2006
- Radiation Effects
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
Date
Featured collections
Popular topics
37 results for Billy L. Crowder
Model for the formation of amorphous Si by ion bombardment
- F.F. Morehead
- B.L. Crowder
- 2006
- Radiation Effects
Radiochemical determination of damage profiles in silicon
- B.J. Masters
- J.M. Fairfield
- et al.
- 2006
- Radiation Effects
Efficient injection electroluminescence in znte by avalanche breakdown
- B.L. Crowder
- F.F. Morehead
- et al.
- 2004
- Applied Physics Letters
Effect of O+ and Ne+ implantation on the surface characteristics of thermally oxidized Si
- N.J. Chou
- B.L. Crowder
- 2003
- Journal of Applied Physics
Formation of amorphous silicon by ion bombardment as a function of ion, temperature, and dose
- F.F. Morehead
- B.L. Crowder
- et al.
- 2003
- Journal of Applied Physics
X-ray topographic determination of the absence of lateral strains in ion-implanted silicon
- K.N. Tu
- P. Chaudhari
- et al.
- 2003
- Journal of Applied Physics
Defining the "random" spectrum as used in the channeling technique of nuclear backscattering
- J.F. Ziegler
- B.L. Crowder
- 2003
- Applied Physics Letters
Elastic and anelastic behavior of ion-implanted silicon
- S.I. Tan
- B.S. Berry
- et al.
- 2003
- Applied Physics Letters
ESR and optical absorption studies of ion-implanted silicon
- B.L. Crowder
- R.S. Title
- et al.
- 2003
- Applied Physics Letters