Publications

12 results for Jacob Savir

On-Chip Weighted Random Patterns
- - Jacob Savir
- 1998
- Journal of Electronic Testing: Theory and Applications (JETTA)
Delay Test Generation: A Hardware Perspective
- - Jacob Savir
- 1997
- Journal of Electronic Testing: Theory and Applications (JETTA)
Layout Influences Testability
- - Thomas H. Spencer
  - Jacob Savir
- 1985
- IEEE TC
Random Pattern Testability
- - Jacob Savir
  - Gary S. Ditlow
  - et al.
- 1984
- IEEE TC
On Random Pattern Test Length
- - Jacob Savir
  - Paul H. Bardell
- 1984
- IEEE TC
Good Controllability and Observability Do Not Guarantee Good Testability
- - Jacob Savir
- 1983
- IEEE TC
A New Empirical Test for the Quality of Random Integer Generators
- - Jacob Savir
- 1983
- IEEE TC
Syndrome-Testing of “Syndrome-Untestable” Combinational Circuits
- - Jacob Savir
- 1981
- IEEE TC
The Weighted Syndrome Sums Approach to VLSI Testing
- - Zeev Barzilai
  - Jacob Savir
  - et al.
- 1981
- IEEE TC
Syndrome-Testable Design of Combinational Circuits
- - Jacob Savir
- 1980
- IEEE TC