The Role of Dynamic Threshold Shifts in the Performance of Inverters and NAND Gates in PD SOI Technology

Denny D. Tang, Tze-Chiang Chen, et al.

IEEE Electron Device Letters

John F. Bulzacchelli, Hae-Seung Lee, et al.

IEEE TAS

Mark B. Ketchen, Manjul Bhushan, et al.

ICMTS 2009

Brian W. Gardner, Janice C. Wynn, et al.

Review of Scientific Instruments