The DX centre
T.N. Morgan
Semiconductor Science and Technology
The structure of crazes in plasticized polystyrene has been studied by means of small‐angle x‐ray scattering and optical interference microscopy. Addition of plasticizer causes a rapid increase in the mean fibril diameter D and a slow decrease in the craze fibril volume fraction vf. The crazing stress σc was also measured and it was found that the product Dσc is independent of plasticizer concentration. These results are shown to be consistent with the entanglement model for controlling vf and the meniscus instability model of craze thickness growth. Copyright © 1986 John Wiley & Sons, Inc.
T.N. Morgan
Semiconductor Science and Technology
K.N. Tu
Materials Science and Engineering: A
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering