Sungjae Lee, Jonghae Kim, et al.
VLSI Technology 2007
Silicon-Germanium (SiGe) power heterojunction bipolar transistors (HBT's) are fabricated by using two or ten device unit cells with an emitter area of 5 × 0.5 × 16.5 μm 2 each. The large power transistor features 1 W rf output power at 3-dB gain compression, 3.5 V bias, and 2.4 GHz with a maximum power-added-efficiency (PAE) of 48% for Class A/B operation. At a supply voltage of 1.5 V, the transistor delivers a 3-dB rf output power of 150 mW with a PAE of 47%. It is shown that a high collector doping level is advantageous for low-voltage operation. Further, by using special bias sense ports, the interconnect losses are found to degrade the device performance to a considerable degree.
Sungjae Lee, Jonghae Kim, et al.
VLSI Technology 2007
Phillip J. Restle, Craig A. Carter, et al.
Digest of Technical Papers-IEEE International Solid-State Circuits Conference
Yanqing Wu, Yu-Ming Lin, et al.
Nature
Joachim N. Burghartz, James H. Comfort, et al.
IEEE Electron Device Letters