Keith A. Jenkins, Walter H. Henkels
IEEE Journal of Solid-State Circuits
Silicon-Germanium (SiGe) power heterojunction bipolar transistors (HBT's) are fabricated by using two or ten device unit cells with an emitter area of 5 × 0.5 × 16.5 μm 2 each. The large power transistor features 1 W rf output power at 3-dB gain compression, 3.5 V bias, and 2.4 GHz with a maximum power-added-efficiency (PAE) of 48% for Class A/B operation. At a supply voltage of 1.5 V, the transistor delivers a 3-dB rf output power of 150 mW with a PAE of 47%. It is shown that a high collector doping level is advantageous for low-voltage operation. Further, by using special bias sense ports, the interconnect losses are found to degrade the device performance to a considerable degree.
Keith A. Jenkins, Walter H. Henkels
IEEE Journal of Solid-State Circuits
Keith A. Jenkins, Joachim N. Burghartz, et al.
IEEE Transactions on Electron Devices
Tian Xia, Peilin Song, et al.
ETS 2004
Joachim N. Burghartz, Michael Hargrove, et al.
IEEE Transactions on Electron Devices