On-chip spectrum analyzer for analog built-in self test
Anup P. Jose, Keith A. Jenkins, et al.
VTS 2005
An experiment to determine the effect of gate electrode resistivity on circuit speed gave unexpected results: circuits with the lowest sheet resistance had the poorest circuit speed. Explanation of this behavior required development of a new high-frequency method of measuring the impedance of the gate electrode. This method revealed that the circuits with a composite gate electrode had been formed with a partial discontinuity. The measurement technique is described, and the evidence of the discontinuity is shown. The effect of the discontinuity on device and circuit speed is demonstrated. © 1996 IEEE.
Anup P. Jose, Keith A. Jenkins, et al.
VTS 2005
Joachim N. Burghartz, Mehmet Soyuer, et al.
IEEE Journal of Solid-State Circuits
Joachim N. Burghartz
ESSDERC 1997
Keith A. Jenkins, Woogeun Rhee, et al.
SiRF 2006