Conference paper
The past, present and future of high-k/metal gates
Kisik Choi, Takashi Ando, et al.
ECS Meeting 2013
Near InfraRed (NIR) photon emission is observed from filaments in HfO2 Resistive Random Access Memories (ReRAMs). This technique is non-destructive and offers rapid localization of filaments, enabling statistical analysis of their spatial distribution. We show that the emission is electric-field driven. We also report direct experimental evidence of ) completely random spatial distribution of filaments across multiple devices and ii) formation of multiple filaments inside a single large device.
Kisik Choi, Takashi Ando, et al.
ECS Meeting 2013
Franco Stellari, Chung Ching Lin, et al.
Electronic Device Failure Analysis
Franco Stellari, Peilin Song, et al.
IEEE JQE
Eduard Cartier, Martin M. Frank, et al.
IRPS 2018