NanoStack Transistor Architecture for CMOS 7A Node and Beyond
- S. Reboh
- C. Zhang
- et al.
- 2025
- VLSI Technology and Circuits 2025
Publications
93 results for Takashi Ando
Assessing the Performance of Analog Training for Transfer Learning
- Omobayode Fagbohungbe
- Corey Lammie
- et al.
- 2025
- ISCAS 2025
Modulating Competition between Defect Generation and Annihilation in Dielectric Breakdown Showing a Full Range of Reverse, Diminishing, and Forward Area Scaling Trends
- Ernest Wu
- Paul Jamison
- et al.
- 2025
- IRPS 2025
Investigation of the effect of oxygen partial pressure during reactive sputtering of tantalum oxide resistive random access memory switching layer
- Rajas Mathkari
- Maximilian Liehr
- et al.
- 2025
- Materials Science in Semiconductor Processing
Assessing the Performance of Analog Training for Transfer Learning
- Omobayode Fagbohungbe
- Corey Lammie
- et al.
- 2025
- IEEE Transactions on Circuits and Systems II Express Briefs
General Statistical Model for Dielectric Breakdown Including Reverse Area Scaling - The Role of Area-Dependent Dynamic Competition
- Ernest Wu
- Takashi Ando
- et al.
- 2024
- IRPS 2024
Analog Resistive Switching Devices for Training Deep Neural Networks with the Novel Tiki-Taka Algorithm
- Tommaso Stecconi
- Valeria Bragaglia
- et al.
- 2024
- Nano Letters
ReSta: Recovery of Accuracy During Training of Deep Learning Models in a 14-nm Technology-Based ReRAM Array
- Fabia Farlin Athena
- Nanbo Gong
- et al.
- 2023
- IEEE T-ED
Material to system-level benchmarking of CMOS-integrated RRAM with ultra-fast switching for low power on-chip learning
- Minhaz Abedin
- Nanbo Gong
- et al.
- 2023
- Scientific Reports
Reversing A Decades-Long Scaling Law of Dielectric Breakdown using Hydrogen-Plasma-Treated HfO2 ReRAM Devices
- Ernest Y. Wu
- Takashi Ando
- et al.
- 2023
- Advanced Electronic Materials