Conference paper
Recent developments in ST-MRAM, including scaling
Eugene J. O'Sullivan, Martin J. Gajek, et al.
ECS Transactions
A method for reducing resistance errors in a collinear four-point probe resistance measurement of a thin film was presented. The positional errors were eliminated to first order using a linear combination of two measurements which differ by interchange of the I- and V-leads. A substantial reduction in absolute error from 3.4% down to 0.01%-0.1%, and an improvement in precision by a factor of 2-4 were shown. The application of the technique to the current-in-plane tunneling method was discussed.
Eugene J. O'Sullivan, Martin J. Gajek, et al.
ECS Transactions
D.C. Worledge, P.L. Trouilloud, et al.
Journal of Applied Physics
D.C. Worledge, P.L. Trouilloud, et al.
Applied Physics Letters
J.Z. Sun, P.L. Trouilloud, et al.
Journal of Applied Physics