Tai Min, Qiang Chen, et al.
IEEE Transactions on Magnetics
A method for reducing resistance errors in a collinear four-point probe resistance measurement of a thin film was presented. The positional errors were eliminated to first order using a linear combination of two measurements which differ by interchange of the I- and V-leads. A substantial reduction in absolute error from 3.4% down to 0.01%-0.1%, and an improvement in precision by a factor of 2-4 were shown. The application of the technique to the current-in-plane tunneling method was discussed.
Tai Min, Qiang Chen, et al.
IEEE Transactions on Magnetics
Y. Guan, D.W. Abraham, et al.
Journal of Applied Physics
D.C. Worledge, G. Hu, et al.
IEDM 2010
S. Assefa, J.Z. Sun, et al.
INTERMAG 2006