M.H. Brodsky, P.J. Stiles
Physical Review Letters
Optical and Hall effect measurements on thin film layers of polycrystalline IrSi1.75 show that this material is a semiconductor. The band gap is approximately 1.2 eV. The films obtained saturated with silicon were p-type with a charge carrier density of the order of 4×1017 cm -3.
M.H. Brodsky, P.J. Stiles
Physical Review Letters
M.H. Brodsky, A. Lurio
Physical Review B
D. Henderson, M.H. Brodsky, et al.
Applied Physics Letters
F.M. D'Heurle, S. Petersson, et al.
Journal of Applied Physics