Conference paper
Impact of SOI history effect on random data signals
Keith A. Jenkins, S. Kim, et al.
ICICDT 2007
Rapid fluctuations of power supply values, or switching noise, can have a significant effect on VLSI circuit speed. This is shown by comparing circuit simulations with measurements of the critical path delay of a self-resetting SRAM. It is shown that including the measured high frequency noise in the circuit simulation leads to very accurate prediction of circuit speed.
Keith A. Jenkins, S. Kim, et al.
ICICDT 2007
M. Soyuer, Keith A. Jenkins, et al.
ISSCC 1996
Keith A. Jenkins, R. Puri, et al.
IEEE International SOI Conference 2001
S.W. Bedell, A. Majumdar, et al.
DRC 2008