Publication
IEDM 2014
Conference paper

Experiment and model for deviation from Pelgrom scaling relation in device width

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Abstract

Through modeling, simulations, and experimental data, we show that FETs exhibit several width dependent characteristics purely due to un-correlated random variations among sub-threshold currents in different width segments. They include unit-width median sub-threshold current and constant-current threshold voltage. The width scaling relation for threshold voltage mismatch is different from Pelgrom scaling relation for sufficiently large variation when compared to the thermal voltage.

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Publication

IEDM 2014

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