PaperAbsence of electrical activity at high-angle grain boundaries in zone-melt-recrystallized silicon-on-insulator filmsP.V. Evans, D.A. Smith, et al.Applied Physics Letters
PaperEffect of arsenic segregation on the electrical properties of grain boundaries in polycrystalline siliconC.Y. Wong, C.R.M. Grovenor, et al.Journal of Applied Physics
Conference paperMICROSTRUCTURE OF NIOBIUM FILMS ORIENTED BY NON-NORMAL INCIDENCE ION BOMBARDMENT DURING GROWTH.J.M.E. Harper, D.A. Smith, et al.MRS Symposium 1985
PaperAnomalous superperiodicity in scanning tunneling microscope images of graphiteM. Kuwabara, D.R. Clarke, et al.Applied Physics Letters
