M. Hargrove, S.W. Crowder, et al.
IEDM 1998
A grain-boundary-dislocation mechanism for diffusion-induced boundary migration is proposed. It is suggested that point-defect emission from grain-boundary dislocations is necessary for the solution and transport of substitutional solutes. Grain-boundary migration occurs as a by-product of the emission of point defects, owing to the requirement that the dislocation remain in the grain-boundary plane. © 1981 Taylor & Francis Group, LLC.
M. Hargrove, S.W. Crowder, et al.
IEDM 1998
Biancun Xie, Madhavan Swaminathan, et al.
EMC 2011
William G. Van der Sluys, Alfred P. Sattelberger, et al.
Polyhedron
Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT