B. Jagannathan, M. Khater, et al.
IEEE Electron Device Letters
The effect of collector lateral scaling on the performance of 300GHz-level SiGe HBTs is investigated. Peak fT and fmax exhibited an initial improvement followed by a degradation with decreasing collector width. Possible causes behind the observed trend are discussed in terms of RC delay and the Kirk effect. © The Institution of Engineering and Technology 2006.
B. Jagannathan, M. Khater, et al.
IEEE Electron Device Letters
M. Khater, J.-S. Rieh, et al.
IEDM 2004
J.-S. Rieh, D.R. Greenberg, et al.
RFIC 2004
J. Dunn, D.L. Harame, et al.
CICC 2006