Noise performance scaling in high-speed silicon RF technologies
D.R. Greenberg, S. Sweeney, et al.
SiRF 2003
This paper reports on SiGe NPN HBTs with unity gain cutoff frequency (f T) of 207 GHz and an f MAX extrapolated from Mason's unilateral gain of 285 GHz. f MAX extrapolated from maximum available gain is 194 GHz. Transistors sized 0.12 × 2.5 μm 2 have these characteristics at a linear current of 1.0 mA/μm (8.3 mA/μm 2). Smaller transistors (0.12 × 0.5 μm 2) have an f T of 180 GHz at 800 μA current. The devices have a pinched base sheet resistance of 2.5 kΩ/sq. and an open-base breakdown voltage BV CEO of 1.7 V. The improved performance is a result of a new self-aligned device structure that minimizes parasitic resistance and capacitance without affecting f T at small lateral dimensions.
D.R. Greenberg, S. Sweeney, et al.
SiRF 2003
Zhen Zhang, F. Pagette, et al.
VLSI-TSA 2010
N. Tega, H. Miki, et al.
VLSI Technology 2009
M. Khater, J.-S. Rieh, et al.
IEDM 2004