PaperReciprocity between the reflection electron microscope and the low-loss scanning electron microscopeOliver C. WellsApplied Physics Letters
ReviewEffects of collector take‐off angle and energy filtering on the BSE image in the SEMOliver C. WellsScanning
PaperUse of backscattered electron detector arrays for forming backscattered electron images in the scanning electron microscopeOliver C. Wells, L. Gignac, et al.Scanning
PaperTop-down topography of deeply etched silicon in the scanning electron microscopeOliver C. Wells, Conal E. Murray, et al.Review of Scientific Instruments
