PaperMagnetically filtered low-loss scanning electron microscopyOliver C. Wells, Francoise K. LeGoues, et al.Applied Physics Letters
PaperComparison of different models for the generation of electron backscattering patterns in the scanning electron microscopeOliver C. WellsScanning
PaperIsolation of type-2 magnetic contrast in the SEM by a lock-in techniqueOliver C. WellsApplied Physics Letters
