Journal of Microscopy

Paper

02 Aug 2011

Method for measuring the field from a magnetic recording head in the scanning electron microscope

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Abstract

No abstract available.

Paper

Magnetically filtered low-loss scanning electron microscopy

Oliver C. Wells, Eric Munro

Ultramicroscopy

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Use of backscattered electron detector arrays for forming backscattered electron images in the scanning electron microscope

Oliver C. Wells, L. Gignac, et al.

Scanning

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Fundamental theorem for type‐1 magnetic contrast in the scanning electron microscope (SEM)

Oliver C. Wells

Journal of Microscopy

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XY table and tilting stage for scanning electron microscope (SEM)

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Review of Scientific Instruments

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