Computer assisted enhanced reflectance data acquisition

Abstract

Accurate, reproducible reflectance measurements are shown to be possible in much less time than here-to-fore realized. Use is made of previously acquired stored data on reflectance 'standards' as well as the TTL compatibility which is now an integral part of the spectrophotometers available commercially. A comparison of typical data obtained by the old method with data obtained by this new technique is reported. © 1981.