Gate stacks for silicon, silicon germanium, and III-V channel MOSFETsMartin M. FrankYu Zhuet al.2014ECS Meeting 2014
Ultrathin (8-14 nm) conformal SiN for sub-20 nm Copper/Low-k InterconnectsSon Van NguyenDeepika Priyadarshiniet al.2014ECS Meeting 2014
Atomic layer deposition of sidewall spacers: Process, equipment and integration challenges in state-of-the-art logic technologiesMichael BelyanskyRichard Contiet al.2014ECS Meeting 2014
Challenges in contact technologies for planar/non-planar Si technologiesPraneet AdusumilliEmre Alptekinet al.2014ECS Meeting 2014