CHARACTERIZATION AND MODELING OF A LATCHUP-FREE 1- mu M CMOS TECHNOLOGY.
- Y. Taur
- W.H. Chang
- et al.
- 1983
- IEDM 1983
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3 results at IEDM 1983
STUDY OF AVALANCHE BREAKDOWN IN SCALED N-MOSFETS.
- S.E. Laux
- F.H. Gaensslen
- 1983
- IEDM 1983
SILICIDE FOR CONTACTS AND INTERCONNECTS.
- C.-Y. Ting
- 1983
- IEDM 1983