On-chip process variation detection using slew-rate monitoring circuit
- Amlan Ghosh
- Rahul M. Rao
- et al.
- 2008
- VLSID 2008
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Optimal dual-VT design in sub-100 nanometer PDSOI and double-gate technologies
- Aditya Bansal
- Jae-Joon Kim
- et al.
- 2008
- VLSID 2008