Summary Abstract: High temperature decomposition of SiO2at the Si/SiO2 interfaceG.W. RubloffR.M. Trompet al.1986JVSTA
Summary Abstract: Energy distributions of electronically excited molecules produced by ion bombardment of siliconR.E. WalkupPh. Avouris1985JVSTA
Properties and Microelectronic Applications of Thin Films of Refractory Metal NitridesMarc Wittmer1985JVSTA
Summary Abstract: The interaction mechanism of inelastic electron tunneling spectroscopy probed by high resolution electron energy loss spectroscopyM. LiehrP.A. Thiryet al.1985JVSTA