Publications

465 results at IEEE T-ED

I-2 Shallow Silicide Contact for Shallow Junction Devices
- - K.N. Tu
- 1981
- IEEE T-ED
Resolution and Linewidth Tolerances in Electron Beam and Optical Projection Lithography
- - Tung Symon Chang
  - David F. Kyser
  - et al.
- 1981
- IEEE T-ED
Josephson Edge-Junction Devices Using E-Beam Lithography
- - Peter Vettiger
  - David F. Moore
  - et al.
- 1981
- IEEE T-ED
Resolution, Overlay, and Field Size for Lithography Systems
- - Alec N. Broers
- 1981
- IEEE T-ED
Device Characterization of an Electron-Beam-Switched Thin-Film ZnS:Mn Electroluminescent Faceplate
- - Omesh Sahni
  - Paul M. Alt
  - et al.
- 1981
- IEEE T-ED
The Pressure Dependence of the Bistable Voltage Margin of an AC Plasma Panel Cell
- - Omesh Sahni
  - M.O. Aboelefotoh
- 1981
- IEEE T-ED
The Effect of Concrete Shielding on Cosmic Ray Induced Soft Fails in Electronic Systems
- - James F. Ziegler
- 1981
- IEEE T-ED
Dual-Electron-Injector-Structure Electrically Alterable Read-Only-Memory Modeling Studies
- - D.J. Dimaria
  - David W. Dong
  - et al.
- 1981
- IEEE T-ED
Evaluation of Light Sources for TDI Polysilicon Electrode CCD Document Scanners
- - A.J. Schell-Sorokin
  - G.W. Lynch
- 1981
- IEEE T-ED
Josephson-Logic Devices and Circuits
- - Tushar R. Gheewala
- 1980
- IEEE T-ED