Device Characterization of an Electron-Beam-Switched Thin-Film ZnS:Mn Electroluminescent Faceplate
- Omesh Sahni
- Paul M. Alt
- et al.
- 1981
- IEEE T-ED
Publications
465 results at IEEE T-ED
Resolution and Linewidth Tolerances in Electron Beam and Optical Projection Lithography
- Tung Symon Chang
- David F. Kyser
- et al.
- 1981
- IEEE T-ED
I-2 Shallow Silicide Contact for Shallow Junction Devices
- K.N. Tu
- 1981
- IEEE T-ED
Resolution, Overlay, and Field Size for Lithography Systems
- Alec N. Broers
- 1981
- IEEE T-ED
Mesostructure Electronics
- Peter J. Price
- 1981
- IEEE T-ED
Dual-Electron-Injector-Structure Electrically Alterable Read-Only-Memory Modeling Studies
- D.J. Dimaria
- David W. Dong
- et al.
- 1981
- IEEE T-ED
IVA-6 Characteristics of AuGeNi Ohmic Contacts to GaAs
- M. Heiblum
- M.I. Nathan
- et al.
- 1981
- IEEE T-ED
Self-Aligned Bipolar Transistors for High-Performance and Low-Power-Delay VLSI
- Tak H. Ning
- Randall D. Isaac
- et al.
- 1981
- IEEE T-ED
VA-5 GaAs Lossy Gate Dielectric FET
- T.L. Andrade
- N. Braslau
- 1981
- IEEE T-ED
TA-A3 Retention Time Studies in Buried-Channel MOSFET Dynamic-Memory Devices
- H.H. Chao
- R.P. Havreluk
- 1980
- IEEE T-ED