PaperElectromigration-induced microstructure evolution in tin studied by synchrotron x-ray microdiffractionAlbert T. Wu, K.N. Tu, et al.Applied Physics Letters
PaperEffect of oxygen distribution on the resistivity in YBa2Cu3O7- oxides (0<0.8)N.C. Yeh, K.N. Tu, et al.Physical Review B
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