High performance bulk planar 20nm CMOS technology for low power mobile applications
- Huiling Shang
- Sameer Jain
- et al.
- 2012
- VLSI Technology 2012
Publications
Date
Featured collections
Popular topics
2 results for Julie Lee
E-beam inspection for detection of sub-design rule physical defects
- Oliver D. Patterson
- Julie Lee
- et al.
- 2012
- ASMC 2012