SRAM Single Bit Cell Soft Failure and Nano-probing Methods
- Zhigang Song
- Michael Tenney
- et al.
- 2024
- ISTFA 2024
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Advanced fault localization through the use of tester based diagnostics with LVI, LVP, CPA and PEM
- Laura Safran
- John Sylvestri
- et al.
- 2013
- ISTFA 2013