Characterization of stacked die using die-to-wafer integration for high yield and throughputK. SakumaP. Andryet al.2008ECTC 2008
Fabrication and characterization of robust through-silicon vias for silicon-carrier applicationsPaul S. AndryCornelia K. Tsanget al.2008IBM J. Res. Dev
3D chip-stacking technology with through-silicon vias and low-volume lead free interconnectionsKatsuyuki SakumaPaul S. Andryet al.2008IBM J. Res. Dev
3D chip stacking technology with low-volume lead-free interconnectionsK. SakumaP. Andryet al.2007ECTC 2007
Assembly, characterization, and reworkability of Pb-free ultra-fine pitch C4s for system-on-packageB. DangS.L. Wrightet al.2007ECTC 2007
A CMOS-compatible process for fabricating electrical through-vias in siliconP. AndryC. Tsanget al.2006ECTC 2006
Characterization of micro-bump C4 interconnects for Si-carrier SOP applicationsS.L. WrightR.J. Polastreet al.2006ECTC 2006
Pb-free micro-joints (50 μm pitch) for the next generation micro-systems: The fabrication, assembly and characterizationH. GanS.L. Wrightet al.2006ECTC 2006