Publications

2 results for Xingchen Chen

Low-energy electron microscopy contrast of stacking boundaries: Comparing twisted few-layer graphene and strained epitaxial graphene on silicon carbide
- - Tobias A. De Jong
  - Xingchen Chen
  - et al.
- 2023
- Physical Review B
Imaging moiré deformation and dynamics in twisted bilayer graphene
- - Tobias A. de Jong
  - Tjerk Benschop
  - et al.
- 2022
- Nature Communications