Publications

2 results for Michael Alles

Total ionizing dose radiation effects on 14 nm FinFET and SOI UTBB technologies
- - Harold Hughes
  - Patrick McMarr
  - et al.
- 2015
- REDW/NSREC 2015
Heavy ion microbeam-and broadbeam-induced transients in SiGe HBTs
- - Jonathan A. Pellish
  - Robert A. Reed
  - et al.
- 2009
- IEEE TNS