Spatially transient stress effects in thin films by X-ray diffraction
- C.E. Murray
- C.C. Goldsmith
- et al.
- 2005
- Powder Diffraction
Publications
66 results for I.C. Noyan
Fourier analysis of X-ray micro-diffraction profiles to characterize laser shock peened metals
- Hongqiang Chen
- Y. Lawrence Yao
- et al.
- 2005
- Int. J. Solids Struct.
Fourier analysis of X-ray microdiffraction profiles to characterize laser shock peened metals
- Hongqiang Chen
- Y. Lawrence Yao
- et al.
- 2004
- NAMRC 2004
Residual stresses in polymeric passivation and encapsulation materials
- I.C. Noyan
- L.T. Nguyen
- 2004
- Polymer Engineering & Science
X‐ray determination of encapsulation stresses on silicon wafers
- L.T. Nguyen
- I.C. Noyan
- 2004
- Polymer Engineering & Science
Finite size effects in stress analysis of interconnect structures
- I.C. Noyan
- Conal E. Murray
- et al.
- 2004
- Applied Physics Letters
Measurement volume considerations in X-ray microdiffraction stress analysis
- I.C. Noyan
- S. Kaldor
- 2004
- Powder Diffraction
Microscale laser shock peening of thin films, part 2: High spatial resolution material characterization
- Wenwu Zhang
- Y.Lawrence Yao
- et al.
- 2004
- Journal of Manufacturing Science and Engineering
Microscale laser shock peening of thin films, Part 1: Experiment, modeling and simulation
- Wenwu Zhang
- Y.Lawrence Yao
- et al.
- 2004
- Journal of Manufacturing Science and Engineering
Strain effects in thin film/Si substrates revealed by X-ray microdiffraction
- C.E. Murray
- I.C. Noyan
- et al.
- 2004
- Powder Diffraction